XRD Machine X-ray Diffraction Analyzers

Name: XRD Machine X-ray Diffraction Analyzers
Brand: Drawell
Price: USD $30,000 - 70,000 / Piece

FOB Price

USD $30,000 - $70,000 / Piece

1 Piece(Min.Order)

Supply Ability 100 Piece / Pieces per Month
Port Shanghai
Payment Terms:T/T Credit Card

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Product Details

Brand Name:

Drawell

Place of Origin:

Shanghai, China

Product Description

X-ray diffraction instrument

DW-XRD-Y3000

Y3000 Series diffractometer is designed for materials research and industrial products analysis. It is the perfect combination of
conventional analysis with special-purpose measurement products.

•The perfect combination of hardware and software systems meets the needs of academics and researchers in different
application areas.

• High precision diffraction angle measurement system obtains more accurate results

• High stability of the X-ray generator control system gets more stable repeatability precision

• Programmable operation, integrated structure design, easy operation, elegant outlook.

X-ray diffraction (XRD) is a versatile test instrument to reveal the crystal structure and chemical information:

• Unkown samples in a variety of phase identification

• Mixed samples with known quantitative phase analysis

• Crystal structure analysis

• Crystal structure changes under Unconventional conditions (high temperature, low temperature conditions)

•Analysis on material surface film

•Analysis on metal material texture and stress

Technique parameters:

XRD-Y3000
Rated power	3kw
Tube voltage	10-60kV
Tube current	5-80mA
X-ray tuble	glass tube, ceramic tube, ripple ceramic tube: Cu, Fe, Co, Cr, Mo etc, Power 2kW
Focus size	1 x 10mm or 0.4 x 14mm or 2 x 12mm
Stability	≤0.01%
Goniometer structure	Horizontal ( θ-2 θ)
Radius of diffraction	185mm
Scanning range	0-164
Scanning speed	0.0012° - 70° min
Max. revolving speed	100° /min
Scanning fashion	θ-2θ linkage, θ,2θ single action; continuous or stepping scanning
Angle repeatable accuracy	1/1000°
Minimal stepping angle	1/1000°
Detector	proportional counters(PC) or scintillation counters(SC)
Maximal counting rate of linearity	5 x 10⁵CPS ( with the compensate function of drop out counting )
Energy resolution ratio	≤25% (PC),≤50% (SC)
Counting fashion	differential coefficient or integral, PHA automatically, Dead time regulate
Stability of system measure	≤0.01%
Scattered rays dose	≤1 μ Sv/h ( without X-ray protective device )
Instrument integrative stability	≤0.5%
Figure size	1100 x 850 x 1750mm

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