Home > Products > IEC Test Finger Probes > IEC 60065 Test Probe Kits
IEC 60065 Test Probe Kits
- 100 Piece / Pieces per Month
- Shenzhen
- T/T PayPal
- 3 days
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Product Details
Brand Name: | Pego | Place of Origin: | China | Model Number: | PG-TP60065 |
Product Description
1. Introduction
The test probe kits are meet the requirement of IEC60065, includes jointed test finger, small finger probes, test pin, rigid test finger, test wire, test rod and test hook, they are applied to test the person’s protection from live parts and hazardous parts of audio, video and similar electronic apparatus.
2. Parameter
Name | Figure number | Description |
Jointed test finger (test probe B) | IEC60065 clause 9.1.1.3 IEC61032 figure 2 | Purpose:Protection of person’s finger from hazardous live parts Specification: 1). Diameter of dactylogryposis: Φ12mm 2). Length of dactylogryposis: 80mm 3). Diameter of baffle. Φ50mm 4). Length of baffle: 100mm 5). Force applied: 20N±2N |
Small Finger probe (Test probe 18) | IEC60065 clause 9.1.1.3 IEC61032 figure 12 | Purpose: Prevent the apparatus from being accessed by children of more than 36 months and less than 14 years Specification: 1). Diameter of probe: Φ8.6mm 2). Length probe: 57.9mm 3). Diameter of first handle: 38.4mm 4). Length of first handle: 101.6mm 5). Diameter of second handle: 38.1mm 6). Length of second handle: 451.6mm |
Small Finger probe (Test probe 19) | IEC60065 clause 9.1.1.3 IEC61032 figure 13 | Purpose: Prevent the apparatus from being accessed by children of 36 months or less. Specification: 2). Length of probe: 44mm 3). Diameter of first handle: 25.9mm 4). Length of first handle: 101.6mm 5). Diameter of second handle: 25.4mm 6). Length of second handle: 464.3mm |
Test pin (test probe 13) | IEC60065 clause 9.1.1.3 IEC61032 figure 9 | Purpose: Protection against access to hazardous live parts in class 0 equipment and class II equipment Specification: 1). Diameter: Φ3mm (head), Φ4mm (tails) 2). Length of probe: 15mm 3). Diameter of baffle: Φ25mm 4). Thickness of baffle: 4mm 5). Force applied: 3N±0.3N |
Metal Test Pin | IEC60065 clause 9.1.3
| Purpose: Test test pin shall no become hazardous live Specification: 1). Diameter: Φ4mm 2). Length: 100mm |
Test Wire (Test Probe D) | IEC60065 clause 9.1.4 IEC61032 figure 4 | Purpose: Test test pin shall no become hazardous live Specification: 1). Diameter of test wire:Φ1mm 2). Length of test wire:100mm 3). Diameter of stop sphere: 35mm 5). Length of handle: 100mm 6). Force applied: 1N±0.1N |
Test Rod (Test Probe C) | IEC60065 clause 9.1.4 IEC61032 figure 3 | Purpose: Test test pin shall no become hazardous live Specification: 1). Diameter of test rod: Φ2.5mm 2). Length of test rod:100mm 3). Diameter of stop sphere: 35mm 5). Length of handle: 100mm 6). Force applied: 10N±1N |
Rigid Test Finger (Test Probe 11) | IEC60065 clause 9.1.7 IEC61032 figure 7 | Purpose: protection against external forces Specification: 1). Diameter of test finger: 12mm 2). Length of test finger: 80mm 3). Diameter of baffle: 50mm 4). Thickness of baffle:5mm 5). Force applied: 50N±5N |
Test Hook | IEC60065 clause 9.1.7 and figure 4 | Purpose: Protection against hazardous live parts Specification: 1). Length: 180mm 2). Width: 8mm 3). Length of hook: 5mm 4). Thickness: 1mm 5). Material: SUS304 stainless steel |
Contact Us
- Pego Electronics (Yi Chun) Company Limited
- Contact namePenny Chat Now
- Phone86-0795-3560528
- AddressNo. 429, Yichun South Road ( Happiness Park), Yuanzhou District, Yichun,Jiangxi
- IEC 61032 Figure 6 12.5mm Test probe 2
- IEC61032 Figure 7 Unjointed Test Finger Probe 11 with 50N Thruster
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- IEC61032 Figure 9 Short Test Pin Probe 13
- IEC61032 Figure 10 Test Probe 14
- IEC61032 Figure 11 Test Probe 17
- IEC61032 Figure 12 Child Finger Test Probe 18 with 8.6mm Diameter
- IEC61032 Figure 13 Child Finger Test Probe 19 with 5.6mm Diameter
- IEC61032 Figure 14 Test Probe 31
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